首页> 外国专利> PELLICLE HAVING A BUFFER ZONE AND A PHOTOMASK STRUCTURE HAVING THE PELLICLE THEREON CAPABLE OF ENSURING THE SURFACE FLATNESS AND OPTICAL PATTERN UNIFORMITY OF THE PHOTOMASK STRUCTURE

PELLICLE HAVING A BUFFER ZONE AND A PHOTOMASK STRUCTURE HAVING THE PELLICLE THEREON CAPABLE OF ENSURING THE SURFACE FLATNESS AND OPTICAL PATTERN UNIFORMITY OF THE PHOTOMASK STRUCTURE

机译:具有缓冲带和光掩膜结构的细胞因此具有能够确保光掩膜结构的表面平整度和光学图案均匀性的能力

摘要

PURPOSE: A pellicle and a photomask structure having the pellicle thereon are provided to disperse pressures applied to the upper surface of the photomask from a frame by forming a buffer zone in the frame.;CONSTITUTION: A photomask structure(50) includes a photomask(44) and a pellicle(40). Optical patterns(48) are formed on the upper surface of the photomask. The pellicle covers the upper surface of the photomask with the optical patterns. The pellicle includes a rectangular frame and a buffer zone. The buffer zone divides the lower surface of the frame into a plurality of regions. The buffer zone removes a part of the lower surface, internal surface, and external surface of the frame. The upper surface of the frame remains. The frame includes sides, and the buffer zone is formed on one of the sides.;COPYRIGHT KIPO 2013
机译:目的:提供防护膜和其上具有防护膜的光掩模结构,以通过在框架中形成缓冲区来分散从框架施加到光掩模上表面的压力。组成:光掩模结构(50)包括光掩模( 44)和表膜(40)。光学图案(48)形成在光掩模的上表面上。防护膜用光学图案覆盖光掩模的上表面。防护膜包括矩形框和缓冲区。缓冲区将框架的下表面分为多个区域。缓冲区除去框架的下表面,内表面和外表面的一部分。框架的上表面仍然保留。框架包括侧面,并且在侧面之一上形成缓冲区。; COPYRIGHT KIPO 2013

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