首页> 外国专利> Method for separating semiconductor silicon wafers from e.g. polycrystalline crystal block for electronic application, involves choosing lengths of saw wire moved in respective directions such that wire point completes number of cycles

Method for separating semiconductor silicon wafers from e.g. polycrystalline crystal block for electronic application, involves choosing lengths of saw wire moved in respective directions such that wire point completes number of cycles

机译:从例如半导体晶片分离半导体硅晶片的方法。用于电子应用的多晶块,涉及选择在各个方向上移动的锯线的长度,以使线点完成循环数

摘要

The method involves periodically reversing a running direction of parallelly moved wires (3) formed by a saw wire (2) from a forward direction to a reverse direction. Length (L) of a workpiece (4) is deviated from reference length, and a pitch (T) of a wire saw is deviated from a reference pitch. Lengths of the saw wire moved in respective forward and reverse directions are chosen in such a manner that a wire point of the saw wire completes a number of cycles from entering of the workpiece up to exit of the workpiece.
机译:该方法包括周期性地将由锯线(2)形成的平行移动的线(3)的行进方向从正向反转为反向。工件(4)的长度(L)偏离基准长度,线锯的节距(T)偏离基准节距。以这样的方式选择在相应的向前和向后方向上移动的锯线的长度,使得锯线的线点完成从进入工件到退出工件的多个循环。

著录项

  • 公开/公告号DE102010010887A1

    专利类型

  • 公开/公告日2011-09-15

    原文格式PDF

  • 申请/专利权人 SILTRONIC AG;

    申请/专利号DE20101010887

  • 申请日2010-03-10

  • 分类号B23D57/00;H01L21/304;B24B27/06;B23D59/00;B28D5/04;

  • 国家 DE

  • 入库时间 2022-08-21 17:47:20

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