首页> 外国专利> Method for analysis of objects by X-ray radiation, involves feeding objects in analysis area with predetermined work cycle, where objects are analyzed in analysis area during standstill period of work cycle

Method for analysis of objects by X-ray radiation, involves feeding objects in analysis area with predetermined work cycle, where objects are analyzed in analysis area during standstill period of work cycle

机译:通过X射线辐射分析对象的方法,涉及以预定的工作周期向分析区域中的对象馈送,其中在工作周期的静止期间在分析区域中分析对象

摘要

The method involves feeding objects in an analysis area with a predetermined work cycle. The objects are analyzed in the analysis area during a standstill period of the work cycle, and the objects are carried away from the analysis area with the work cycle. The object has a container (3.1) filled with a medium. The mass and presence of foreign bodies or the number of the objects is determined by the analysis. Independent claims are also included for the following: (1) a device for analysis of objects by X-ray radiation; and (2) an automatic filling and analysis device comprises a filling unit.
机译:该方法包括以预定的工作周期将物体送入分析区域。在工作周期的停顿期间,将在分析区域中分析对象,并且随着工作周期将这些对象从分析区域中带走。该物体具有装有介质的容器(3.1)。通过分析确定异物的质量和存在或物体的数量。还包括以下方面的独立权利要求:(1)一种用于通过X射线辐射分析对象的设备; (2)自动填充和分析装置,包括填充单元。

著录项

  • 公开/公告号DE102009008708A1

    专利类型

  • 公开/公告日2010-08-26

    原文格式PDF

  • 申请/专利权人 DELIPETKOS ELIAS;

    申请/专利号DE20091008708

  • 发明设计人 DELIPETKOS ELIAS;

    申请日2009-02-12

  • 分类号G01N23/10;

  • 国家 DE

  • 入库时间 2022-08-21 18:28:23

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