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TEM SAMPLE PREPARATION METHOD, TEM SAMPLE, AND THIN SECTION SAMPLE

机译:TEM样品制备方法,TEM样品和薄截面样品

摘要

PROBLEM TO BE SOLVED: To fix a thin section sample on a sample holder without tilting a stage and to efficiently prepare a TEM sample in a shorter time with increasing throughput.;SOLUTION: The TEM sample preparation method prepares a TEM sample 1 by fixing a thin section sample 2 to a sample holder 3 after taking out the thin section sample from a sample S disposed on a stage, in which the method comprises a step of preparing the thin section sample formed integrally from a thin section body 2a formed into a rectangular shape in plan view and a projection part 2b projecting laterally from a part of side face of the thin section body by perforating the sample by etching processing using a focused ion beam; a step of moving the thin section sample to near the sample holder; a step of contacting the thin section sample with the sample holder so that the projection part contacts with the surface of the sample holder; and a step of fixing the projection part and the sample holder by a deposition film D by irradiating around the projection part with a focused ion beam while supplying raw material gas around the projection.;COPYRIGHT: (C)2010,JPO&INPIT
机译:解决的问题:将薄片样品固定在样品架上而不倾斜平台,并在更短的时间内有效地制备TEM样品,从而提高了通量。解决方案:TEM样品制备方法通过固定样品架来制备TEM样品1从放置在平台上的样品S中取出薄片样品后,将薄片样品2移至样品架3,其中该方法包括准备由形成为矩形的薄片体2a整体形成的薄片样品的步骤。通过使用聚焦离子束的蚀刻处理对样品进行穿孔,在平面图中形成为形状,并从薄片主体的侧面的一部分向侧面突出的突出部2b。将薄片样品移至样品架附近的步骤;使薄壁样品与样品架接触的步骤,以使突出部与样品架的表面接触。 ;以及通过将聚焦的离子束照射在突出部分周围,同时在突出部分周围供应原料气体的同时通过沉积膜D固定突出部分和样品架的步骤。版权所有:(C)2010,JPO&INPIT

著录项

  • 公开/公告号JP2010002308A

    专利类型

  • 公开/公告日2010-01-07

    原文格式PDF

  • 申请/专利权人 SII NANOTECHNOLOGY INC;

    申请/专利号JP20080161661

  • 发明设计人 NAKATANI IKUKO;MITSU KIN;

    申请日2008-06-20

  • 分类号G01N1/28;G01N1/32;

  • 国家 JP

  • 入库时间 2022-08-21 18:59:29

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