首页> 外国专利> STRAIN DEVELOPMENT LOCATION DETECTING PARTS AND STRAIN DEVELOPMENT LOCATION DETECTING DEVICE

STRAIN DEVELOPMENT LOCATION DETECTING PARTS AND STRAIN DEVELOPMENT LOCATION DETECTING DEVICE

机译:应变发展位置检测部件和应变发展位置检测设备

摘要

PROBLEM TO BE SOLVED: To provide strain development location detecting parts capable of pinpointing a strain maximum place correctly to be attached correctly on the strain maximum place as well as a strain developmental location detecting device.;SOLUTION: When outreach strain develops on the strain development location detecting parts, as crack and disconnection arise at the development location, the strain development location can be pinpointed by observing crack location and disconnection location even after strain is lost. As a result, at quantitative measurement of strain a strain gauge can be correctly stuck on a location strain is large, making it possible to implement exact strain measurement.;COPYRIGHT: (C)2009,JPO&INPIT
机译:解决的问题:提供应变发展位置检测部件,该部件能够准确地确定应变最大位置并正确地安装在应变最大位置上;以及应变发展位置检测装置。位置检测部件,当在展开位置出现裂纹和断开时,即使在应变消失后,也可以通过观察裂纹位置和断开位置来确定应变的展开位置。结果,在应变的定量测量中,应变仪可以正确地粘贴在较大的位置应变上,从而可以进行精确的应变测量。版权所有:(C)2009,JPO&INPIT

著录项

  • 公开/公告号JP2008309721A

    专利类型

  • 公开/公告日2008-12-25

    原文格式PDF

  • 申请/专利权人 RICOH CO LTD;

    申请/专利号JP20070159241

  • 发明设计人 WATANABE HIDEO;

    申请日2007-06-15

  • 分类号G01B11/14;

  • 国家 JP

  • 入库时间 2022-08-21 19:40:45

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