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METHOD FOR FABRICATING AFM NANOTUBE PROBE AND AFM NANOTUBE PROBE THEREBY
METHOD FOR FABRICATING AFM NANOTUBE PROBE AND AFM NANOTUBE PROBE THEREBY
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机译：由此制造AFM纳米管探针的方法和AFM纳米管探针
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摘要
The present invention relates to a method for manufacturing a nanotube probe of an atomic force microscope (AFM) and a nanotube probe manufactured by such a method, and more particularly, a tip of a probe to which a nanotube is attached. The heterojunction between the nanotubes and the nanotubes allows the nanotubes to be more firmly fixed to the tip of the probe, and the heterojunction can improve the conductivity between the probe and the nanotubes, unlike conventional nanotube probes. The method of manufacturing AFM nanotube probes and nanotube probes manufactured by such methods, which can fundamentally prevent impurities from adhering to nanotubes attached to the tip of the nanotube probe, can provide a scanning image superior to conventional nanotube probes. It is about. Method of manufacturing a nanotube probe of the AFM according to the present invention, the step of attaching the nanotube to the tip (tip) of the probe, the step of placing the probe on the metal substrate attached to the probe, the probe Irradiating a laser on the raised metal substrate to heat the metal substrate.
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