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Mass spectrum analysis device, mass spectrum analysis method, and mass spectrum analysis program

机译：质谱分析装置，质谱分析方法和质谱分析程序

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摘要

There are provided a mass spectrum analysis device, a mass spectrum analysis method, and a mass spectrum analysis program capable of accurately analyzing a mass spectrum. ;The mass spectrum device analyzes a mass spectrum measured for a plurality of samples. The mass spectrum device includes peak position detection means 14 for detecting a peak position where the mass spectrum is at its peak, and coincidence degree calculation means 15 for calculating the coincidence degree of peaks according to the number of peak positions detected in a plurality of mass spectra that is contained in a window having a width for a mass number.

机译：提供了一种能够准确地分析质谱的质谱分析装置，质谱分析方法和质谱分析程序。 ;质谱仪分析对多个样品测得的质谱。该质谱仪装置包括：峰值位置检测装置 14 ，用于检测质谱在其峰值处的峰值位置;以及重合度计算装置 15 ，用于计算质谱的重合度。根据在具有质量数的宽度的窗口中包含的多个质谱图中检测到的峰位置的数目，确定峰。 展开▼

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公开/公告号US2007181797A1

专利类型

公开/公告日2007-08-09

原文格式PDF

申请/专利权人 KAZUHIKO UCHIDA;MASAMI SATO;JUNYA NISHIGUCHI;SHINSUKE YAMASAKI;
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申请/专利号US20050570211

发明设计人 KAZUHIKO UCHIDA;MASAMI SATO;JUNYA NISHIGUCHI;SHINSUKE YAMASAKI;
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申请日2005-06-08

分类号H01J49/00;

国家 US

入库时间 2022-08-21 21:03:56

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