首页> 外国专利> Estimating remaining operating life of x-ray source involves predicting remaining operating life from predicted profile of measurement values measured at intervals and threshold value stored for individual x-ray source

Estimating remaining operating life of x-ray source involves predicting remaining operating life from predicted profile of measurement values measured at intervals and threshold value stored for individual x-ray source

机译:估计X射线源的剩余使用寿命包括根据间隔测量的测量值的预测轮廓和为单个X射线源存储的阈值来预测剩余使用寿命。

摘要

The method involves determining a suitable measurement value at time intervals under specified test conditions, storing the measurement values in a memory, predicting a profile of future measurement values for the current and stored values and determining the predicted remaining operating life from the predicted profile and a threshold value stored for the individual x-ray source.
机译:该方法包括在指定的测试条件下按时间间隔确定合适的测量值,将测量值存储在存储器中,预测当前值和存储值的未来测量值的分布,并根据预测的分布和测量来确定预测的剩余使用寿命。为各个X射线源存储的阈值。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号