首页> 外国专利> METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE FOR PREVENTING RESIDUES OF CONDUCTIVE MATERIAL DUE TO MOAT

METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE FOR PREVENTING RESIDUES OF CONDUCTIVE MATERIAL DUE TO MOAT

机译:制造用于防止导电物质残留的半导体装置的方法

摘要

Purpose: it is a kind of to be arranged to prevent the residue of a conductive material due to moat by improving the profile of the edge portion in an isolated area for manufacturing the method for semiconductor device, use a low reduction part of a pad oxide layer. Construction: a pad oxide layer (32) and a pad nitride mode (34) are formed in semi-conductive substrate (30). The one of one pad oxide layer is low, and reduction part is formed by executing isotropic etching on substrate. One bar ditch (36) form pad nitride mode as an etching mask by execution anisotropic etching in substrate purposes.
机译:目的:一种通过改善隔离区域中边缘部分的轮廓来防止由于mo沟引起的导电材料残留的制造方法,用于制造半导体器件的方法,并使用低氧化率的焊盘氧化物层。构造:在半导体衬底(30)中形成垫氧化物层(32)和垫氮化物模式(34)。一层垫氧化物层之一低,并且通过在基板上执行各向同性蚀刻来形成还原部分。一个条形沟槽(36)通过出于衬底目的执行各向异性蚀刻而形成垫氮化物模式作为蚀刻掩模。

著录项

  • 公开/公告号KR20050002442A

    专利类型

  • 公开/公告日2005-01-07

    原文格式PDF

  • 申请/专利权人 HYNIX SEMICONDUCTOR INC.;

    申请/专利号KR20030043820

  • 发明设计人 CHA YOUNG KUK;

    申请日2003-06-30

  • 分类号H01L21/76;

  • 国家 KR

  • 入库时间 2022-08-21 22:06:03

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