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MOCVD selective deposition of c-axis oriented Pb5Ge3O11 thin films on high-k gate oxides

机译:在高k栅氧化物上MOCVD选择性沉积c轴取向Pb5Ge3O11薄膜

摘要

A method of forming a PGO thin film on a high-k dielectric includes preparing a silicon substrate, including forming a high-k gate oxide layer thereon; patterning the high-k gate oxide; annealing the substrate in a first annealing step; placing the substrate in a MOCVD chamber; depositing a PGO thin film by injecting a PGO precursor into the MOCVD chamber; and annealing the structure having a PGO thin film on a high-k gate oxide in a second annealing step.
机译:在高k电介质上形成PGO薄膜的方法包括:制备硅衬底,包括在其上形成高k栅氧化层;构图高k栅极氧化物;在第一退火步骤中退火衬底;将衬底放置在MOCVD室中;通过将PGO前体注入MOCVD腔室来沉积PGO薄膜;在第二退火步骤中,在高k栅极氧化物上对具有PGO薄膜的结构进行退火。

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