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Method for testing a memory device under test on a memory tester applies the same sequence of transmission vectors to a memory under test and to a main memory within the memory tester comparing sample test data for both.
Method for testing a memory device under test on a memory tester applies the same sequence of transmission vectors to a memory under test and to a main memory within the memory tester comparing sample test data for both.
A memory tester has memory data records that can be configured for use as error catch RAM (ECR), tag RAM, buffer memory and stimulus LOG RAM. Different functions are implemented in memory data records that serve as a host for such functions. An ECR can demand a whole memory data record for itself based on its size and a desire for purpose-oriented high-speed data paths.
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