首页> 外国专利> X-ray scintillation detector array for use in computer tomography, etc. has improved detection efficiency through use of separation layers between detector elements that do not extend through the whole scintillator layer

X-ray scintillation detector array for use in computer tomography, etc. has improved detection efficiency through use of separation layers between detector elements that do not extend through the whole scintillator layer

机译:通过在计算机断层摄影等中使用的X射线闪烁探测器阵列,通过使用不延伸到整个闪烁体层的探测器元件之间的隔离层,提高了探测效率

摘要

Matrix type detector array (21) for detection of X- radiation, where each element (7) is comprised of scintillator material and a photoelectric detector (11). Between neighboring elements is a separation layer of non-scintillating material. The material does not extend through the full width of the scintillator material. The invention also relates to a corresponding method for operating a detector array and a manufacturing method.
机译:用于检测X射线的矩阵型检测器阵列(21),其中每个元件(7)由闪烁体材料和光电检测器(11)组成。在相邻元件之间是非闪烁材料的隔离层。该材料不会延伸通过闪烁体材料的整个宽度。本发明还涉及用于操作检测器阵列的相应方法和制造方法。

著录项

  • 公开/公告号DE10110673A1

    专利类型

  • 公开/公告日2002-09-26

    原文格式PDF

  • 申请/专利权人 SIEMENS AG;

    申请/专利号DE2001110673

  • 发明设计人 HAAR THOMAS VON DER;

    申请日2001-03-06

  • 分类号G01T1/29;G01N23/083;A61B6/03;

  • 国家 DE

  • 入库时间 2022-08-22 00:27:04

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