首页> 外国专利> Electrochemical etching cell for etching silicon wafers uses electrode materials that do not contaminate and/or damage the etching body after etching

Electrochemical etching cell for etching silicon wafers uses electrode materials that do not contaminate and/or damage the etching body after etching

机译:用于蚀刻硅片的电化学蚀刻池使用的电极材料在蚀刻后不会污染和/或损坏蚀刻体

摘要

The first and second electrode material are selected so that the etching body (15) is not contaminated and/or not damaged after etching through the electrode materials. Electrochemical etching cell for etching an etching body having a surface of etching material comprises a chamber partially filled with an electrolyte and contains a first electrode (13) with a surface made of first electrode material and a second electrode (13') with a surface made of a second electrode material. One of the electrodes is connected as anode and the other as cathode. The etching body is in contact with the electrolyte. The first and second electrode material are selected so that the etching body (15) is not contaminated and/or not damaged after etching through the electrode materials.
机译:选择第一和第二电极材料,使得在通过电极材料进行蚀刻之后,蚀刻体(15)不被污染和/或不被损坏。用于蚀刻具有蚀刻材料的表面的蚀刻体的电化学蚀刻单元包括部分填充有电解质的腔室,并包含具有由第一电极材料制成的表面的第一电极(13)和具有由第一电极材料制成的表面的第二电极(13')。第二电极材料。电极之一连接为阳极,另一个电极连接为阴极。蚀刻体与电解质接触。选择第一和第二电极材料,使得在通过电极材料进行蚀刻之后,蚀刻体(15)不被污染和/或不被损坏。

著录项

  • 公开/公告号DE19914905A1

    专利类型

  • 公开/公告日2000-10-05

    原文格式PDF

  • 申请/专利权人 ROBERT BOSCH GMBH;

    申请/专利号DE1999114905

  • 发明设计人 ARTMANN HANS;LAERMER FRANZ;FREY WILHELM;

    申请日1999-04-01

  • 分类号C25F3/02;C25F7/00;

  • 国家 DE

  • 入库时间 2022-08-22 01:42:14

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