首页> 外国专利> method and device for dosage of impurities in a gas by gas chromatography and application to the calibration of dotierenden impurities in silan.

method and device for dosage of impurities in a gas by gas chromatography and application to the calibration of dotierenden impurities in silan.

机译:气相色谱法测定气体中杂质含量的方法和装置,并将其应用于硅烷中多铁氧烯杂质的标定。

摘要

The device for determining impurities in a gas by gas phase chromatography comprises: … …  - a device (2) for cryogenic trapping of the impurities, equipped with a column packed with granules of a product which adsorbs the impurities, means for refrigeration capable of maintaining the column at a low temperature during the passage of the gas carrying impurities and means for reheating with a view to subsequent desorption; …  - a first gas phase chromatograph (15) with a view to a preliminary analysis, equipped with a column with a packing 17, 18, 19 for each impurity; …  - a device (32) for cryogenic recentring of the impurities, equipped with a capillary column, means for refrigeration capable of maintaining the column at low temperature during the passage of a carrier gas which has passed through the first chromatograph (15) and means for desorption reheating; … and a second gas phase chromatograph (34) equipped with a capillary column 36, a detection device (38) being placed at the exit. …IMAGE…
机译:用于通过气相色谱法测定气体中杂质的装置包括:......-用于低温捕集杂质的装置(2),该装置装有装有吸附了杂质的产品颗粒的柱子,该制冷装置能够保持在携带杂质的气体通过的过程中,该柱处于低温状态,以及为了随后解吸而进行再加热的装置; …-为了初步分析的第一台气相色谱仪(15),其色谱柱配有针对每种杂质的填料17、18、19; …-配备毛细管柱的用于杂质低温冷冻的装置(32),该装置用于在已经通过第一色谱仪(15)的载气通过期间将柱保持在低温状态的制冷装置和装置用于解吸加热; ……以及配备有毛细管柱36的第二气相色谱仪(34),检测装置(38)放置在出口处。 …<图像>…

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