The analyzer by ellipsometry, the method of analysis ellipsometry of a sample and the application to the extent of variation of thickness of the thin layers

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• 2. 用于制造椭圆芯保偏光纤的光纤预制棒及椭圆芯保偏光纤的制造工艺 [P] . 中国专利： CN110104945A . 2019-08-09
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  机译： 椭偏分析仪，椭偏分析仪，用于测量样品，测量薄层厚度变化的方法。

• 4. ELLIPSOMETRY ANALYZER, SAMPLE ELLIPSOMETRIC ANALYSIS METHOD, AND THIN FILM THICKNESS VARIATION MEASUREMENT MEASUREMENT [P] . 法国专利： FR2628211A1 . 1989-09-08

  机译： 椭偏分析仪，样品椭偏分析方法和薄膜厚度变化量测量

• 5. Apparatus for analysis by ellipsometry, procedure for ellipsometric analysis of a sample and application to the measurement of variations in the thickness of thin films [P] . 美国专利： US5018863A . 1991-05-28

  机译： 椭圆偏光分析仪，椭圆偏光分析程序及用于测量薄膜厚度变化

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• 6. Thickness Dispersion of Surface Plasmon of Ag Nano-thin Films: Determination by Ellipsometry Iterated with Transmittance Method [O] . Junbo Gong, Rucheng Dai, Zhongping Wang, -1
• 7. Application of Ellipsometry to Control the Plasmachemical Synthesis of Thin TiONx Layers [O] . F. N. Dultsev, E. A. Kolosovsky 2015
• 8. Simultaneous Determination of Refractive Index and Thickness of Very Thin Films by Ellipsometry [R] . Rai, R. 1967

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• 2. Error Corrected Sub-Monolayer Ellipsometry for Measurement of Biomolecular Interactions [J] . Udo Riss . 生物物理学期刊（英文） . 2013,第1期
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• 4. 椭偏光谱学在透明衬底上吸收薄膜厚度及光学常数表征中的应用研究 [A] . 李江 . 2015