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A method for examining the physical properties of thin layers and electrode - optically active thin layers

机译:检查薄层和电极-光学活性薄层的物理性质的方法。

摘要

the invention concerns a procedure for the investigation of the physical properties of thin electro optically active substances. $a this is done by means of polarized light with which the test layer is irradiated, and the reflected light.transmitted acoustic light on an imaging system is run, with the study of polarized light transmission layer by the lichtleitermoden are encouraged, in the case of an electro optically active layer, using a modulated electric field and eb surveys using, where possible, to modulate.
机译:本发明涉及研究薄的光学旋光活性物质的物理性质的方法。 $ a这是通过照射测试层的偏振光和反射光来完成的。在成像系统上运行透射的声光,在这种情况下,鼓励用lichtleitermoden研究偏振光透射层使用调制的电场对电光学活性层进行光调制,并在可能的情况下使用eb测量进行调制。

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