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Method for examining the physical properties of thin electro-optically active layers
Method for examining the physical properties of thin electro-optically active layers
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机译:检查薄的光电有源层的物理性质的方法
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摘要
The invention relates to a method for examining the physical properties of thin electro-optically active substances. This is performed with the aid of polarised light, by means of which the layer to be examined is irradiated and the reflected light or transmitted light is directed onto an imaging system, the irradiation of the polarised light exciting in the layer to be examined optical fibre modes which in the case of an electrooptically active layer can be modulated with the aid of an applied, likewise modulated electric field. IMAGE
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