首页> 外国专利> Method for examining the physical properties of thin electro-optically active layers

Method for examining the physical properties of thin electro-optically active layers

机译:检查薄的光电有源层的物理性质的方法

摘要

The invention relates to a method for examining the physical properties of thin electro-optically active substances. This is performed with the aid of polarised light, by means of which the layer to be examined is irradiated and the reflected light or transmitted light is directed onto an imaging system, the irradiation of the polarised light exciting in the layer to be examined optical fibre modes which in the case of an electrooptically active layer can be modulated with the aid of an applied, likewise modulated electric field. IMAGE
机译:本发明涉及一种检查薄的光电活性物质的物理性能的方法。这借助于偏振光来执行,通过该偏振光照射待检查的层并将反射光或透射光引导到成像系统上,在待检查的光纤中激发偏振光的照射在电光活性层的情况下,可以借助于施加的,同样调制的电场来调制这些模式。 <图像>

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号