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ANALYSIS OF THE PHYSICAL PROPERTIES OF THIN LAYERS AND ELECTRO-OPTICALLY ACTIVE THIN LAYERS
ANALYSIS OF THE PHYSICAL PROPERTIES OF THIN LAYERS AND ELECTRO-OPTICALLY ACTIVE THIN LAYERS
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机译:薄层和光电活性薄层的物理性能分析
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摘要
O.Z. 0050/43148Abstract of the Disclosure: A method of analysing thephysical properties of thin electro-optically activesubstances uses polarized light, with which the layer tobe analysed is irradiated, and the reflected light ortransmitted light is diverted onto an imaging system,polarized light being used on the layer to be analysed inorder to excite waveguide modes which, with the aid ofan applied modulated electrical field, can likewise bemodulated in the case of an electro-optically activelayer.
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