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ANALYSIS OF THE PHYSICAL PROPERTIES OF THIN LAYERS AND ELECTRO-OPTICALLY ACTIVE THIN LAYERS

机译:薄层和光电活性薄层的物理性能分析

摘要

O.Z. 0050/43148Abstract of the Disclosure: A method of analysing thephysical properties of thin electro-optically activesubstances uses polarized light, with which the layer tobe analysed is irradiated, and the reflected light ortransmitted light is diverted onto an imaging system,polarized light being used on the layer to be analysed inorder to excite waveguide modes which, with the aid ofan applied modulated electrical field, can likewise bemodulated in the case of an electro-optically activelayer.
机译:O.Z. 0050/43148披露摘要:一种分析风险的方法薄光电有源的物理性质物质使用偏振光,该层与被分析,然后反射光或透射光被转移到成像系统上在要分析的层上使用的偏振光为了激发波导模式,借助于施加的调制电场同样可以是在光电激活的情况下进行调制层。

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