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Healing crystal lattice damage of silicon doped with phosphorus - by neutron irradiation involving tempering in atmos. contg. phosphorus
Healing crystal lattice damage of silicon doped with phosphorus - by neutron irradiation involving tempering in atmos. contg. phosphorus
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机译:掺磷的硅的中子辐照涉及大气回火的修复晶格损伤。续磷
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摘要
Process is carried out for min. 1 hr. at above 1000 degrees C pref. for 8 hrs. at 1230 degrees C. The crystals can be pretempered in an atmos. contg. P for 4 h t min. 1000 degrees C, pref. 1100 degrees C. The process is used in semiconductor elements. The electrical characteristics of the crystals are stabilised. Pref. Si crystal wafers are tempered in a P atmos. produced by a P coating. After P diffusion for 1.5 h at 1150 degrees C the P coating is removed and tempering is carried out in the same furnace. Above 600 degrees C heating and cooling take place at max. 3 degrees C/min.
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机译:进行至少1分钟的处理。 1小时在高于1000摄氏度的温度下持续8小时。可以在1230摄氏度的温度下将晶体预热。续P持续4 h t分钟。 1000摄氏度,优选1100摄氏度。该工艺用于半导体元件。晶体的电特性稳定。首选硅晶体晶片在P atmos中回火。由P涂层生产。 P在1150摄氏度下扩散1.5小时后,将P涂层去除,并在同一炉中进行回火。高于600摄氏度时,最高会进行加热和冷却。 3摄氏度/分钟。
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