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Comparison test piece and ultrasonic phased array flaw detection test method

机译:比较试验片和超声相位阵列探伤试验方法

摘要

PROBLEM TO BE SOLVED: To provide a reference test piece and a supersonic phased array flaw testing method, capable of finely adjusting sensitivity of a supersonic flaw test device having a matrix array probe and checking performances of the matrix array probe.;SOLUTION: A reference test piece 10 is for sensitivity adjustment of a supersonic flaw test device used for supersonic flaw test including a matrix array probe 3 formed by two-dimensionally arraying a plurality of ultrasonic elements 3a, and comprises: a flaw detection surface 11 on which the matrix array probe 3 is arranged; and a plurality of flat-bottomed holes 15 formed radially in the test piece with, as centre, ultrasonic wave incident point O of the matrix array probe 3 arranged on the flaw detection surface 11. Respective flat bottom surfaces 15b of the plurality of flat-bottomed holes 15 are arranged facing each other to reflect supersonic wave incident from the matrix array probe 3 through the ultrasonic wave incident point O toward the ultrasonic wave incident point O.;SELECTED DRAWING: Figure 2;COPYRIGHT: (C)2019,JPO&INPIT
机译:要解决的问题:提供参考试验片和超音速相控阵漏洞测试方法,能够精细地调节具有矩阵阵列探针的超音速缺陷测试装置的灵敏度和检查矩阵阵列探针的性能。;解决方案:参考试验片10是用于超音速调节的超音速缺陷测试装置,其包括通过二维排列多个超声元件3a的二维排列形成的矩阵阵列探针3,并且包括:致散矩阵阵列的探伤表面11探针3被安排;并且多个平底孔15在试验片中径向形成,作为矩阵阵列探针3的矩阵阵列探针3,布置在探伤表面11上。多个平板的相应的平坦底表面15b底孔15彼此面对地布置,以通过朝向超声波入射点O反映从矩阵阵列探头3入射的超音波。所选择的绘图:图2;版权:(c)2019,JPO和INPIT

著录项

  • 公开/公告号JP6871534B2

    专利类型

  • 公开/公告日2021-05-12

    原文格式PDF

  • 申请/专利权人 株式会社IHI;

    申请/专利号JP20170203643

  • 发明设计人 川崎 拓;畠中 宏明;田中 尚之;

    申请日2017-10-20

  • 分类号G01N29/30;G01N29/26;

  • 国家 JP

  • 入库时间 2022-08-24 18:38:27

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