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Orientation-Dependent Anisotropic Etching Simulation in Silicon Wafer

机译:硅晶片中与方向有关的各向异性刻蚀模拟

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摘要

The anisotropic etching simulation is an important tool to fabricate sensors and actuators. The wet etching has been studied and characterized for the release of micro-mechanical structures and simulation in front side bulk micro-machining. For the orientation-dependent etching simulation processes, it is necessary the silicon etching rates determination for certain conditions, and in this work 100 silicon wafers type n, were used, etched in potassium hydroxide solution (KOH). Simulations were accomplished to verify the simulators effectiveness and to observe the planes formation in real and simulated structures.
机译:各向异性蚀刻仿真是制造传感器和执行器的重要工具。已经对湿法刻蚀进行了研究,并对湿法刻蚀进行了表征,以揭示微机械结构的释放并模拟了正面整体微加工。对于与方向有关的蚀刻模拟过程,有必要确定某些条件下的硅蚀刻速率,在这项工作中,使用了100个n型硅晶片,并在氢氧化钾溶液(KOH)中进行了蚀刻。完成仿真以验证仿真器的有效性并观察真实和仿真结构中的平面形成。

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