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首页> 外文会议>2003 Nanotechnology Conference and Trade Show Nanotech 2003 Vol.3 Feb 23-27, 2003 California, USA >Size Effect on the Elastic Modulus of Nanomaterials as Measured by Resonant Contact Atomic Force Microscopy
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Size Effect on the Elastic Modulus of Nanomaterials as Measured by Resonant Contact Atomic Force Microscopy

机译：共振接触原子力显微镜测得的纳米材料弹性模量的尺寸效应

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摘要

The elastic modulus of metallic (Ag and Pb) nanowires and polymer (polypyrrole, PPy) nanotubes was measured using a novel method, resonant contact atomic force microscopy (resonant C-AFM). The cantilever vibration is excited with an electric field applied between the sample holder and the AFM head. The resonance frequency of the cantilever in contact with the sample shifts to higher values compared to the free resonance frequency. Its value depends on the stiffness of the tip-sample contact. It is shown that this method enables to quantitatively measure the Young's modulus of nanotubes or nanowires. The obtained results are discussed in terms of an effect of the reduced size on the measured elastic modulus.
机译：使用新型方法，共振接触原子力显微镜（共振C-AFM）测量了金属（Ag和Pb）纳米线和聚合物（聚吡咯，PPy）纳米管的弹性模量。悬臂的振动是由样品架和AFM头之间施加的电场激发的。与自由共振频率相比，与样品接触的悬臂的共振频率偏移更高的值。其值取决于尖端样品接触的刚度。结果表明，该方法能够定量测量纳米管或纳米线的杨氏模量。根据减小的尺寸对所测量的弹性模量的影响来讨论所获得的结果。

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