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Computer performance microscopy with Shim

机译：使用Shim的计算机性能显微镜

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Developers and architects spend a lot of time trying to understand and eliminate performance problems. Unfortunately, the root causes of many problems occur at a fine granularity that existing continuous profiling and direct measurement approaches cannot observe. This paper presents the design and implementation of Shim, a continuous profiler that samples at resolutions as fine as 15 cycles; three to five orders of magnitude finer than current continuous profilers. Shim's fine-grain measurements reveal new behaviors, such as variations in instructions per cycle (IPC) within the execution of a single function. A Shim observer thread executes and samples autonomously on unutilized hardware. To sample, it reads hardware performance counters and memory locations that store software state. Shim improves its accuracy by automatically detecting and discarding samples affected by measurement skew. We measure Shim's observer effects and show how to analyze them. When on a separate core, Shim can continuously observe one software signal with a 2% overhead at a ∼1200 cycle resolution. At an overhead of 61%, Shim samples one software signal on the same core with SMT at a ∼15 cycle resolution. Modest hardware changes could significantly reduce overheads and add greater analytical capability to Shim. We vary prefetching and DVFS policies in case studies that show the diagnostic power of fine-grain IPC and memory bandwidth results. By repurposing existing hardware, we deliver a practical tool for fine-grain performance microscopy for developers and architects.
机译：开发人员和架构师花费大量时间来尝试理解和消除性能问题。不幸的是，许多问题的根本原因是现有的连续分析和直接测量方法无法观察到的精细程度。本文介绍了Shim的设计和实现，Shim是一种连续的轮廓仪，其分辨率高达15个周期。比当前的连续轮廓仪精细三到五个数量级。 Shim的细粒度测量揭示了新的行为，例如在执行单个功能时每周期指令（IPC）的变化。 Shim观察程序线程在未使用的硬件上自动执行和采样。作为示例，它读取硬件性能计数器和存储软件状态的内存位置。 Shim通过自动检测和丢弃受测量偏斜影响的样本来提高其准确性。我们测量Shim的观察者效果并展示如何分析它们。在单独的内核上时，Shim可以以1200个周期的分辨率连续观察2个开销的软件信号。 Shim的开销为61％，使用SMT在约15个周期的分辨率下在同一内核上采样一个软件信号。适度的硬件更改可以显着减少开销，并为Shim增加更大的分析能力。在案例研究中，我们会改变预取和DVFS策略，以显示细粒度IPC的诊断能力和内存带宽结果。通过重新利用现有硬件，我们为开发人员和架构师提供了用于细粒度性能显微镜的实用工具。

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