首页> 外文会议>European Conference on Computer Vision(ECCV 2004) pt.4; 20040511-20040514; Prague; CZ >The Isophotic Metric and Its Application to Feature Sensitive Morphology on Surfaces
【24h】

The Isophotic Metric and Its Application to Feature Sensitive Morphology on Surfaces

机译:等渗度量及其在表面特征形态学中的应用

获取原文
获取原文并翻译 | 示例

摘要

We introduce the isophotic metric, a new metric on surfaces, in which the length of a surface curve is not just dependent on the curve itself, but also on the variation of the surface normals along it. A weak variation of the normals brings the isophotic length of a curve close to its Euclidean length, whereas a strong normal variation increases the isophotic length. We actually have a whole family of metrics, with a parameter that controls the amount by which the normals influence the metric. We are interested here in surfaces with features such as smoothed edges, which are characterized by a significant deviation of the two principal curvatures. The isophotic metric is sensitive to those features: paths along features are close to geodesies in the isophotic metric, paths across features have high isophotic length. This shape effect makes the isophotic metric useful for a number of applications. We address feature sensitive image processing with mathematical morphology on surfaces, feature sensitive geometric design on surfaces, and feature sensitive local neighborhood definition and region growing as an aid in the segmentation process for reverse engineering of geometric objects.
机译:我们引入了等距度量,这是一种在曲面上的新度量,其中曲面曲线的长度不仅取决于曲线本身,还取决于曲面法线沿其变化的方式。法线的弱变化使曲线的等熵长度接近其欧几里得长度,而法线的强变化则增加了等熵长度。实际上,我们有整个度量标准系列,其中有一个参数控制法线影响度量标准的数量。在这里,我们对具有平滑边缘等特征的表面感兴趣,这些特征的特征在于两个主曲率的显着偏离。等张度量对那些特征敏感:沿着特征的路径在等张度量中接近于测地线,穿过特征的路径具有高等长。这种形状效果使等张性度量可用于许多应用程序。我们处理表面上具有数学形态学的特征敏感图像处理,表面上具有特征敏感的几何设计以及具有特征敏感的局部邻域定义和区域增长的功能,以帮助对几何对象进行逆向工程的分割过程。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号