首页> 外文会议>International Conference on Nitride Semiconductors(ICNS-5); 20030525-20030530; Nara; JP >High transconductance AlGaN/GaN-HEMT with recessed gate on sapphire substrate
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High transconductance AlGaN/GaN-HEMT with recessed gate on sapphire substrate

机译:在蓝宝石衬底上具有凹入式栅极的高跨导AlGaN / GaN-HEMT

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摘要

Recessed gate AlGaN/GaN high electron mobility transistors (HEMTs) grown on sapphire substrate have been fabricated. In order to improve FET performances, we optimized the layer structure and the electrode arrangement of the HEMT, and hence 0.15 μm gate-length AlGaN/GaN-HEMTs with recessed gate were successfully fabricated and the obtained transconductance was as high as 450 mS/mm. In this paper we describe the improvement of HEMT layer structures on sapphire substrate, the optimisation of an offset arrangement of gate electrodes, and the results of DC/RF measurements of our HEMTs.
机译:已经制造出在蓝宝石衬底上生长的嵌入式栅极AlGaN / GaN高电子迁移率晶体管(HEMT)。为了提高FET性能,我们优化了HEMT的层结构和电极排列,因此成功地制造了栅极长度为0.15μm的具有凹入式栅极的AlGaN / GaN-HEMT,并且获得的跨导高达450 mS / mm 。在本文中,我们描述了蓝宝石衬底上HEMT层结构的改进,栅电极偏移排列的优化以及HEMT的DC / RF测量结果。

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