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Reactive Ion Etching of Silicon Carbide with Patterned Boron Implantation

机译:图案化硼注入对碳化硅的反应离子刻蚀

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摘要

Dependence of 4H-SiC etch rate in SF_6 containing plasmas on the bulk concentration of implanted Boron as well as on post implantation regimes was investigated. The samples were selectively ion doped up to Boron bulk concentration of 1·10~(19)cm~(-3) and annealed under Ar flow at temperatures of 1500 and 1600℃ for varying durations. The difference up to 15% in etch rate of Boron doped and undoped 4H-SiC has been observed. It was found that this etch rate difference decreases with increasing of post implantation annealing time and with decreasing of Boron bulk concentration. It is assumed that this difference is defined by residual lattice damages induced during the implantation.
机译:研究了含SF_6的等离子体中4H-SiC蚀刻速率对注入的硼的体积浓度以及注入后机制的依赖性。样品被选择性地离子掺杂至硼的总浓度为1·10〜(19)cm〜(-3),并在1500和1600℃的Ar流下退火不同的时间。已经观察到硼掺杂和未掺杂的4H-SiC的蚀刻速率差异高达15%。发现该蚀刻速率差随着注入后退火时间的增加和硼体积浓度的减小而减小。假定该差异是由植入期间引起的残余晶格损伤定义的。

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