A Time Dependent Dielectric Breakdown(TDDB) Prognostic Monitor

机译：时间相关介电击穿（TDDB）预后监测仪

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摘要

A TDDB monitoring circuit structure for an on-chip end-of-life indicators disclosed here, which can be integrated and degraded with the device, and give an alarm when the device needs replacing. This will estimate down time of the system where this IC is used and this circuit structure only needs a very small area.

机译：这里公开的用于片上寿命终止指示器的TDDB监视电路结构可以与器件集成和降级，并在需要更换器件时发出警报。这将估计使用该IC的系统的停机时间，并且该电路结构仅需要很小的面积。

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来源
《International Conference on Solid-State and Integrated Circuit Technology(ICSICT-2006); 20061023-26; Shanghai(CN)》|2006年|P.1174-1176|共3页
会议地点 Shanghai(CN)
作者
Yu-Bing Lv; YiQi Zhuang; XiaoMing Li; Hao Bai; DangHui Wang;
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作者单位

Department of Microelectronics, Xidian University, Xi'an 710071, China;

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原文格式 PDF
正文语种 eng
中图分类半导体技术;
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3. Time-dependent dielectric breakdown (TDDB) reliability analysis of CMOS analog and radio frequency (RF) circuits [J] . Sanic Mustafa Tarik, Yelten Mustafa Berke Analog Integrated Circuits and Signal Processing . 2018,第1期

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5. Modeling and Simulation Methods for VLSI Interconnect Reliability Focusing on Time Dependent Dielectric Breakdown [D] . Peng, Shaoyi. 2021

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6. Proton Irradiation Effects on the Time-Dependent Dielectric Breakdown Characteristics of Normally-Off AlGaN/GaN Gate-Recessed Metal-Insulator-Semiconductor Heterostructure Field Effect Transistors [O] . Dongmin Keum, Hyungtak Kim 2019

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7. Time-dependent dielectric breakdown (TDDB) distribution in n-MOSFET with HfSiON gate dielectrics under DC and AC stressing [O] . Hirano Izumi, Nakasaki Yasushi, Fukatsu Shigeto, 2013

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A Time Dependent Dielectric Breakdown(TDDB) Prognostic Monitor

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