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TWO-DIMENSIONAL SIMULATION OF AlGaAs/InGaAs/GaAs PHEMTs

机译:AlGaAs / InGaAs / GaAs PHEMT的二维模拟

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摘要

A two-dimensional energy transport model for the pseudomorphic high electron mobility transistor (PHEMT) is described. The calculation is based upon self-consistent solving of the hydrodynamic equations (continuity equation and energy transport equation) in conjunction with Poisson's equation and Schrodinger's equation. Schrodinger's equation is solved in one-dimensional slices perpendicular to the interface. The model accounts for hot electron effects, degeneracy, surface-states effects, real space transfer, quantum effects, and buffer injection phenomena. The results obtained using this model for a 0.25 μm gate length delta-doped AlGaAs/InGaAs/GaAs PHEMT are found to agree very well with those obtained from experimental device.
机译:描述了用于伪高电子迁移率晶体管(PHEMT)的二维能量传输模型。该计算基于结合泊松方程和薛定inger方程的流体力学方程(连续性方程和能量传输方程)的自洽解。薛定inger方程是在垂直于界面的一维切片中求解的。该模型考虑了热电子效应,简并,表面态效应,实际空间转移,量子效应和缓冲剂注入现象。使用该模型获得的栅极长度为0.25μm的AlGaAs / InGaAs / GaAs PHEMT的结果与从实验装置获得的结果非常吻合。

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