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首页> 外文会议>International Symposium on State-of-the-Art Application of Surface and Interface Analysis Methods to Environmental Material Interactions: in Honor of James E.Castle's 65th Year, Mar 26-27, 2001, Washington D.C. >SCANNING NEAR-FIELD INFRARED MICROSCOPY
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SCANNING NEAR-FIELD INFRARED MICROSCOPY

机译：扫描近场红外显微镜

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摘要

Commonly, location specific chemical identification by means of vibrational spectroscopy in the infrared region is largely restricted to samples of macroscopic dimensions, on the order of one to several microns; the scale of the examined area is completely determined by the diffraction limit of the incident radiation. However, chemical identification at length scales less than the diffraction limit is possible using a scanned probe technique, the Scanning Near-Field Infrared Microscope (SNFIM). Using a scanned probe technique in the near-field, resolution of chemical features on the order of λ/20 or ≈ 100 nm can be achieved. An overview of previous experimental results using a free electron laser (FEL) and more conventional infrared sources will be discussed. Recent results from the SNFIM experiment at Jefferson Lab will also be presented.
机译：通常，借助于红外光谱中的振动光谱法进行的位置特定化学识别在很大程度上限于宏观尺寸的样品，数量级为一到几微米。被检查区域的大小完全取决于入射辐射的衍射极限。但是，使用扫描探针技术扫描近场红外显微镜（SNFIM）可以在小于衍射极限的长度范围内进行化学鉴定。在近场中使用扫描探针技术，可以实现大约λ/ 20或≈100 nm的化学特征分辨率。将讨论使用自由电子激光（FEL）和更常规的红外光源的先前实验结果的概述。还将介绍Jefferson Lab的SNFIM实验的最新结果。

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