首页> 外文会议>61st Electronic Components Technology Conference, 2011 >Modeling, optimization and benchmarking of chip-to-chip electrical interconnects with low loss air-clad dielectrics
【24h】

Modeling, optimization and benchmarking of chip-to-chip electrical interconnects with low loss air-clad dielectrics

机译:具有低损耗空气包覆电介质的芯片到芯片电气互连的建模,优化和基准测试

获取原文

摘要

Analytical models are developed for pulse response of chip-to-chip interconnects modeled as lossy transmission lines. The novel compact physical models capture the losses due to skin effect and dielectric losses and predict both the pulse height and width at the receiver. The work presented in this paper demonstrates the use of these models for optimization of data-rate and interconnect geometry in order to minimize energy-per-bit and maximize bandwidth-density simultaneously. Further, the model is applied to explore and quantify the potential benefits of low-k air-clad dielectrics that reduce dielectric losses. The model predicts a maximum improvement of ideal air dielectric over a lossy GETEK dielectric to be roughly 5–6 times in both energy-per bit and bandwidth-density. Additionally, the optimizations provided in the paper set the minimum requirements for optical interconnects in order to outperform electrical interconnects.
机译:开发了用于建模为有损传输线的芯片间互连脉冲响应的分析模型。新颖的紧凑型物理模型捕获了趋肤效应和介电损耗引起的损耗,并预测了接收器的脉冲高度和宽度。本文介绍的工作演示了如何使用这些模型来优化数据速率和互连几何结构,以最小化每位能量并同时最大化带宽密度。此外,该模型还用于探索和量化降低介电损耗的低k空气包覆电介质的潜在优势。该模型预测,理想的空气电介质相对于有损GETEK电介质的最大改善是每位能量和带宽密度的大约5至6倍。此外,本文提供的优化设置了光互连的最低要求,以胜过电互连。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号