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Optical column of the mask-scan eb mask writer test stand

机译:掩模扫描EB面罩作家试验台的光学柱

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A deficiency in throughput is one of the main problems for the post-100 nm generation mask writer. Mask-scan writing technology is one of the methods for increasing in the throughput. A large pattern is projected by scanning the electron beam (EB) over the mask pattern. We have developed a low aberration optical column to prove the concept of the mask-scan technology. We obtained the EB mask pattern image by scanning the electron beam over the mask. We confirmed the capability of the astigmatism correction by the bias voltage superposed on the main field deflectors.
机译:吞吐量的缺陷是100纳米生成掩模作家的主要问题之一。掩模扫描写入技术是吞吐量增加的方法之一。通过在掩模图案上扫描电子束(EB)来投射大图案。我们开发出低距离光学柱来证明掩模扫描技术的概念。我们通过在掩模上扫描电子束获得EB掩模图案图像。我们通过叠加在主场偏转器上的偏置电压确认了散光校正的能力。

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