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Comprehensive metrology-detection strategies for sub-0.5um lithography reticles

机译:小于0.5um光刻掩模版的全面计量检测策略

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Abstract: The 'edge detection' is a known problem in optical linewidth metrology. New illumination capabilities like Real Time Broad Band Confocal Scanning, the combination of conventional transmitted illumination with real time confocal scanning, and near UV transmitted illumination, used for metrology of finite transmissive/reflective masks, require a reevaluation of the traditional edge detection approach. For the masks with finite reflectivities or transmission on both sides of an edge the traditional 50% threshold does not describe at all the true edge location. Edge response function and Edge response width were reviewed for confocal scanning illumination and for typical finite transmissive (binary) masks. The proposed edge detection strategy deals with edge position shift with detection threshold in different illumination conditions and the relationship between the detection threshold and 'best' focal plane selected for measurement. 'Edge roughness', another known problem was reviewed from different prospectives and measurements of the edge roughness were performed at various edge detection thresholds. Mapping of mask feature 'aerial intensity' was used to view the edge roughness, edge slope and to locate edge position. Aerial intensity simulations with SOLID-C simulation tool were in very good agreement with the experimental data.!6
机译:摘要:“边缘检测”是光学线宽计量学中的一个已知问题。实时宽带共聚焦扫描,常规透射照明与实时共聚焦扫描以及近紫外透射照明等新的照明功能(用于有限的透射/反射掩模的计量)需要重新评估传统的边缘检测方法。对于在边缘的两侧具有有限反射率或透射率的掩模,传统的50%阈值根本无法描述真实的边缘位置。审查了共聚焦扫描照明和典型的有限透射(二进制)掩模的边缘响应函数和边缘响应宽度。所提出的边缘检测策略处理在不同照明条件下具有检测阈值的边缘位置偏移,以及检测阈值与选择用于测量的“最佳”焦平面之间的关系。从不同的角度回顾了另一个已知问题“边缘粗糙度”,并在各种边缘检测阈值下进行了边缘粗糙度的测量。使用遮罩特征“航空强度”的映射来查看边缘粗糙度,边缘倾斜度和定位边缘位置。使用SOLID-C模拟工具进行的空中强度模拟与实验数据非常吻合!! 6

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