• 主题
高级搜索  >
历史搜索 清空历史
首页> 外文会议>Chemical Sensors Ⅳ >A NARROWBAND IMPEDANCE MEASUREMENT TECHNIQUE FOR THICKNESS SHEAR MODE RESONATOR SENSORS
【24h】

A NARROWBAND IMPEDANCE MEASUREMENT TECHNIQUE FOR THICKNESS SHEAR MODE RESONATOR SENSORS

机译：厚度剪切模式谐振器传感器的窄带阻抗测量技术

获取原文
页面导航
  • 摘要
  • 著录项
  • 相似文献
  • 相关主题

摘要

This paper discusses a new technique for measuring the impedance response of thickness shear mode (TSM) resonators used as fluid monitors and chemical sensors. The technique simulates the swept frequency measurements performed by an automatic network analyzer (ANA), determining the complex reflection scattering parameter, S_(11), from single port devices. Unlike oscillator circuits most often used with TSM resonators, narrowband spectral measurements are not limited by cable capacitance between resonator and oscillator allowing placement of the sensor in severe environments. Only noise produced by long cable lengths limits performance and sensor sensitivity. This new technique utilizes a simple swept frequency source operating near the crystal resonance, a unique directional coupler to provide the reference and reflected RF signals, an I & Q demodulation circuit that returns two dc voltages, and computational algorithms for determining sensor response parameters. Performance has been evaluated by comparing TSM resonator responses using this new technique to those from a commercial ANA.
机译：本文讨论了一种用于测量用作流体监测器和化学传感器的厚度剪切模式（TSM）谐振器的阻抗响应的新技术。该技术模拟自动网络分析仪（ANA）进行的扫频测量，从单端口设备确定复数反射散射参数S_（11）。与最常用于TSM谐振器的振荡器电路不同，窄带频谱测量不受谐振器和振荡器之间的电缆电容的限制，从而可以将传感器放置在恶劣的环境中。只有长电缆产生的噪声会限制性能和传感器灵敏度。这项新技术利用了在晶体谐振附近工作的简单扫频源，提供参考信号和反射RF信号的独特定向耦合器，返回两个直流电压的I＆Q解调电路以及用于确定传感器响应参数的计算算法。通过比较使用这种新技术的TSM谐振器响应与商用ANA的响应，可以评估性能。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱：kefu@zhangqiaokeyan.com

京公网安备：11010802029741号 ICP备案号：京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有

  • 客服微信

  • 服务号