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Measurement Technique of Carrier Mobility in Silicon Nitride and its Application to Data Retention in MONOS Memories

机译:氮化硅中载流子迁移率的测量技术及其在Monos Memories中的数据保留中的应用

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A novel method to measure carrier mobilities in insulators such as silicon nitride was developed. The transport parameters were determined by measuring the threshold voltage shift and the gate leakage current during the retention simultaneously. The electric field and the temperature dependence of the mobility in Si3N4 shows the trap barrier lowering proportional to the electric field (E) in contrast with the Poole-Frenkel emission theory, where the trap barrier reduction is proportional to Efrac12. Based on the measured parameters, data retention characteristics are predictable for different device structures with a single parameter set.
机译:开发了一种用于测量诸如氮化硅等绝缘体中载体迁移率的新方法。通过同时在保持期间测量阈值电压偏移和栅极漏电流来确定传输参数。电场和Si 3 n 4 在迁移率的温度依赖性显示了与电磁场(e)相反的陷阱屏障与Poole-Frenkel发射相比理论,捕获屏障减少与E FRAC12 成比例。基于测量的参数,数据保持特性对于具有单个参数集的不同设备结构是可预测的。

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