首页> 外文会议>Conference on challenges in process integration and device technology >Prospective Technology for System-on-a-Chip: N_2 implant followed by VHP O_2 re-oxidation
【24h】

Prospective Technology for System-on-a-Chip: N_2 implant followed by VHP O_2 re-oxidation

机译:芯片系统的前瞻性技术:N_2植入物,其次是VHP O_2重新氧化

获取原文

摘要

A novel technique -N_2 ion implant (N_2 I/I) followed by vertical high pressure (VHP) O_2 re-oxidation in a furnace, capable of growing oxides of multiple thickness is presented. It is observed that the oxidation rate can be well modulated by varying the N_2 I/I dose, and VHP O_2 re-oxidation provides enhanced oxide growth rate and controls the ntrogen profile in the film, as compared to RTO or furnace O_2 re-oxidation. Therefore, more than 500
机译:一种新的技术-N_2离子植入物(N_2 I / I),然后呈现在炉中的垂直高压(VHP)O_2再氧化,能够产生多层厚度的氧化物。观察到氧化率可以通过改变N_2 I / I剂量进行良好调节,并且VHP O_2再氧化提供增强的氧化物生长速率并与RTO或炉子O_2重新氧化相比,对膜中的烟叶分布进行控制。因此,超过500

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号