Recently attempts to detect the lateral force gradient between the single atoms at non-contact region have been carried out [1,2]. However the large peak-to-peak dithering amplitudes of several nm, and intently or accidentally given tilt angles from the parallel to the surface confuse us the interpretation of the observed images. Therefore the small-amplitude lateral dynamic force microscopy (DLFM) with high atomic resolution on the order of sub-Angstrom has been developed to detect Pico Newton-order friction [2,3]. Nevertheless the mechanism of atomic resolution of the DLFM has not been clarified yet. In this talk, we will report simulation method of the two-dimensional images of the small amplitude DLFM regulated by the STM of Si(111)7×7 reconstructed surface.
展开▼
