首页> 外文会议>International Workshop on Microwave and Millimeter Wave Circuits and System Technology >2D simulations of non-local transport effects in deep-submicrometer HEMTs
【24h】

2D simulations of non-local transport effects in deep-submicrometer HEMTs

机译:2D模拟深层底尺寸的非局部运输效果

获取原文

摘要

In this paper, conventional drift-diffusion model was introduced and the disadvantage was analysed when the device dimensions shrink to deep-submicrometer regime, non-local effects are expected to become more prominent. To investigate non-local transport effects in InAlAs/InGaAs HEMT's, energy-balance model was taken into account. Velocity overshoot caused by non-equivalence of electron momentum and energy relaxation times was analysed and is responsible for the increasing drain current and transconductance.
机译:在本文中,介绍了传统的漂移扩散模型,并且当器件尺寸缩小到深层逐渐计量方案时,分析了缺点,预期非局部效应将变得更加突出。为了调查Inalas / Ingaas HEMT的非本地运输效果,考虑了能量平衡模型。分析了电子动量和能量松弛时间的非等价性引起的速度过冲,并负责漏极电流和跨导的增加。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号