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A Study of the Absorption Edge of ZnO Thin Films Prepared by the Spray Pyrolysis Method

机译:喷雾热解法制备ZnO薄膜吸收边缘的研究

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Zinc oxide (ZnO) thin films are produced by the spray pyrolysis method on glass substrates at 450°C. The films are characterized using X-ray diffraction (XRD) and UV-VIS transmittance spectroscopy. XRD pattern showed that the films are polycrystalline with hexagonal (wurtzite) structure. Transmittance was measured at room temperature in the wavelength range 350-1100 nm, and used to deduce the absorbance. The fourth derivative of the absorbance is used to detect the peaks in the near-band edge region. Several peaks are found in the region of interest, from which are the free exciton peaks A, B, and C; bound exciton peaks related to defects and impurities; and very weak peaks assigned to longitudinal optical phonon replicas. These results are important for solar cells, room temperature UV laser, and other photonic and optoelectronic applications.
机译:氧化锌(ZnO)薄膜通过在450℃下的玻璃基板上的喷雾热解方法产生。 使用X射线衍射(XRD)和UV-Vis透射谱检查表征膜。 XRD图案表明,薄膜是具有六边形(紫吨石)结构的多晶。 在650-1100nm的波长范围内的室温下测量透射率,并用于推导吸光度。 吸光度的第四衍生物用于检测近带边缘区域中的峰。 在感兴趣的区域中发现了几个峰,它是自由激子峰A,B和C; 与缺陷和杂质有关的结合激子峰; 非常弱的峰分配给纵向光学声子复制品。 这些结果对于太阳能电池,室温UV激光器和其他光子和光电应用很重要。

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