Implementation of phase-stepping interferometry to transmitted-light DICmicroscopy for dielectric surface evaluation,

机译：对透射光DIC显微镜进行相位步进干涉测量以进行介电表面评估，

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Abstract: The phase stepping technique with dia illumination is proposed to evaluate surface relief of dielectric layers. An easy implementation is described in a commercially available polarized light interference microscope and experimental results are presented. !16

机译：摘要：提出了一种采用直径照明的相位步进技术来评估介电层的表面起伏。在市售的偏振光干涉显微镜中描述了一种简单的实现方式，并给出了实验结果。！16

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《Phase Contrast and Differential Interference Contrast Imaging Techniques and Applications》|1992年|p.212-221|
会议地点 Warsaw(PL)
作者
Malgorzata Sochacka; Univ. of Santiago de Compostela (Spain); Warszawa; Poland; Franck Le Provost; I.U.T. of Angers; Angers; France.;
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正文语种 eng
中图分类无线电电子学、电信技术;
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4. Implementation of phase-stepping interferometry to transmitted-light DIC microscopy for dielectric surface evaluation [C] . Author(s): Malgorzata Sochacka Univ. of Santiago de Compostela (Spain) Warszawa Poland, Franck Le Provost I.U.T. of Angers Angers France. Phase Contrast and Differential Interference Contrast Imaging Techniques and Applications . 1992

机译：相位步进干涉法在透射电DIC显微镜下的介电表面评估
5. Noise reduction in THz-TDS dielectric characterization of thin films with THz interferometry. [D] . Small, Jay A. 2004

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Implementation of phase-stepping interferometry to transmitted-light DICmicroscopy for dielectric surface evaluation,

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