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Studies of active Nd-doped Silicon Rich Silicon Oxide waveguides

机译：有源钕掺杂富硅氧化硅波导的研究

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摘要

The Nd~(3+)-doped Silicon Rich Silicon Oxide (SRSO) layers were elaborated by reactive magnetron co-sputtering. We report on refractive index measurements of Nd~(3+)-doped SRSO layers obtained by both m-lines method and reflectance spectroscopy. From these measurements, the Si volume fraction and also the Nd~(3+)-doped SRSO index dispersion were deduced by using the Bruggeman model. At 1.06 μm, work wavelength, Nd~(3+)-doped SRSO refractive index was equal to 1.543 corresponding to a Si volume fraction of 6.5%.Optical losses measurements were performed on these waveguides at different wavelengths and were about 0.3 dB/cm at 1.55 μm and 1 dB/cm at 1.06 μm. Measurements are confirmed by theoretical models showing that the losses are essentially attributed to surface scattering.Guided fluorescence by top pumping at 488 nm on planar waveguides was studied as a function of the distance between the excitation area and the output of the waveguide and also as a function of the pump power. The guided fluorescence at 945 and 1100 nm was observed until 4mm of the output of the waveguide and, of course, decreased when the excitation area moved away from the output. The fluorescence intensity increased linearly for low pump power and this linear increasing of the guided fluorescence of Nd~(3+) excited by a non resonant excitation at 488 nm confirms the strong coupling between the Si- nanoparticles and rare earth ions.
机译：通过反应磁控共溅射对Nd〜（3+）掺杂的富硅氧化硅（SRSO）层进行了精细加工。我们报告了通过m线法和反射光谱法获得的Nd〜（3+）掺杂SRSO层的折射率测量结果。从这些测量中，通过使用布鲁格曼模型推导了Si的体积分数以及Nd〜（3+）掺杂的SRSO指数色散。在1.06μm的工作波长下，掺Nd〜（3+）的SRSO折射率等于1.543，对应的Si体积分数为6.5％。在这些波导上进行了不同波长的光损耗测量，约为0.3 dB / cm 1.55μm时为1 dB / cm，1.06μm时为1 dB / cm。理论模型证实了测量结果，表明损耗基本上是表面散射引起的。研究了在平面波导上于488 nm处顶部抽运产生的荧光随激发面积和波导输出之间距离的变化的关系。泵功率的功能。观察到在945和1100 nm处的引导荧光，直到波导输出的4mm，并且当激发区域移离输出时，当然会减小。对于低泵浦功率，荧光强度线性增加，并且在488 nm处由非共振激发激发的Nd〜（3+）的引导荧光的线性增加证实了Si-纳米颗粒与稀土离子之间的强耦合。

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  • 来源
    《Photonics, devices, and systems V》|2011年|p.83061J.1-83061J.7|共7页
  • 会议地点 Prague(CS)
  • 作者

    Parastesh Pirasteh; Joel Charrier; Yannick Dumeige; Jean-Louis Doualan; Patrice Camy; Olivier Debieu; Yarm G. Boucher; Fabrice Gourbilleau;

  • 作者单位

    Universite Europeenne de Bretagne, CNRS FOTON, UMR 6082, ENSSAT BP8O_518, F-22305 Lannion Cedex, France;

    Universite Europeenne de Bretagne, CNRS FOTON, UMR 6082, ENSSAT BP8O_518, F-22305 Lannion Cedex, France;

    Universite Europeenne de Bretagne, CNRS FOTON, UMR 6082, ENSSAT BP8O_518, F-22305 Lannion Cedex, France;

    CIMAP, UMR CNRS/CEA/ENSICAEN/UCBN, 6 Bid Marechal Juin F-14050 CAEN Cedex,France;

    CIMAP, UMR CNRS/CEA/ENSICAEN/UCBN, 6 Bid Marechal Juin F-14050 CAEN Cedex,France;

    CIMAP, UMR CNRS/CEA/ENSICAEN/UCBN, 6 Bid Marechal Juin F-14050 CAEN Cedex,France;

    Universite Europeenne de Bretagne, CNRS FOTON, UMR 6082, ENSSAT BP8O_518, F-22305 Lannion Cedex, France;

    CIMAP, UMR CNRS/CEA/ENSICAEN/UCBN, 6 Bid Marechal Juin F-14050 CAEN Cedex,France;

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  • 正文语种 eng
  • 中图分类 工程光学;
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