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Modeling and Simulation of Oxygen Precipitation in CZ Silicon

机译:CZ硅中氧析出的建模与模拟

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This paper describes modeling and simulation for the growth and dissolution of oxygen precipitates in Czochralski silicon(CZ) wafers during heat treatment. Growth and dissolution rates are newly derived and inserted into a set of chemical rate equations(CREs) and a Fokker-Planck equation(FPE). Annealing am-bients and surface conditions are taken into account for solving continuity equations in order to calculate oxygen depth profile and oxygen precipitates density more precisely.
机译:本文介绍了在热处理过程中切克劳斯基硅(CZ)晶片中氧沉淀物的生长和溶解的建模和仿真。生长速率和溶出速率是新推导的,并插入到一组化学速率方程(CRE)和Fokker-Planck方程(FPE)中。为了求解连续性方程,需要考虑退火环境和表面条件,以便更精确地计算氧气深度分布和氧气沉淀物密度。

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