首页> 外文会议>Symposium on Quantum Confined Semiconductor Nanostructures Dec 2-5, 2002 Boston, Massachusetts, U.S.A. >PATTERNED STRUCTURES OF SILICON NANOCRYSTALS PREPARED BY PULSED LASER INTERFERENCE CRYSTALLIZATION OF ULTRA-THIN A-SI:H SINGLE-LAYER
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PATTERNED STRUCTURES OF SILICON NANOCRYSTALS PREPARED BY PULSED LASER INTERFERENCE CRYSTALLIZATION OF ULTRA-THIN A-SI:H SINGLE-LAYER

机译:超薄A-SI:H单层脉冲激光干涉结晶制备的硅纳米晶的结构

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We employ the method of phase-modulated KrF excimer pulsed laser interference crystallization to fabricate nanometer-sized crystalline silicon (nc-Si) with the two-dimensional (2D) patterned distribution within the ultra-thin a-Si:H single-layer. The local crystallization occurs after interference laser irradiation under proper energy density. The results of atomic force microscopy, Raman scattering spectroscopy, cross-section transmission electron microscopy and scanning electron microscopy demonstrate that Si nano-crystallites are formed within the initial a-Si:H single-layer, selectively located in the discal regions with the diameter of 350 nm and patterned with the same 2D periodicity of 2.0 μm as the phase-shifting grating. The results show that the present method can be used to fabricate patterned nc-Si films for device applications.
机译:我们采用相位调制KrF准分子脉冲激光干涉结晶的方法来制造在超薄a-Si:H单层内具有二维(2D)图案分布的纳米级晶体硅(nc-Si)。在适当的能量密度下,在干涉激光照射之后,发生局部结晶。原子力显微镜,拉曼散射光谱,横截面透射电子显微镜和扫描电子显微镜的结果表明,硅纳米晶体形成于初始a-Si:H单层内,选择性地位于直径为直径的盘状区域中。波长为350 nm,并以与移相光栅相同的2.0μm二维周期进行构图。结果表明,本方法可用于制造用于器件应用的图案化的nc-Si膜。

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