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Band-structure calculations for one- and two-dimensional defects in zinc-blende III-V nitrides.

机译:闪锌矿III-V氮化物中一维和二维缺陷的能带结构计算。

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摘要

Linearized Muffin-Tin Orbital (LMTO) calculations were performed to study the electronic structure and bonding of point defects in cubic (zinc-blende) BN (c-BN), AlN (c-AlN), and GaN (c-GaN), and for a highly strained AlN/BN superlattice. Anion and cation vacancies were studied in c-BN and c-GaN, as were various anion and cation substitutional impurities: Be and Mg in c-BN, Mg in c-AlN, and O, Zn and Cd in c-GaN.; Benchmark calculations were performed to verify the accuracy and optimize the efficiency of the calculations. Large outward relaxation was predicted for atoms neighboring vacancies and impurities in c-BN. Small outward relaxation was predicted near Mg impurities in c-AlN. Except for the Zn impurity in c-GaN, donor and acceptor bands tended to be moderately to highly localized near defect sites. Type II alignment was predicted for the relaxed (001) AlN/BN superlattice. AlN layers bore the greatest strain and exhibited the greatest band bending.
机译:进行了线性化的Muffin-Tin轨道(LMTO)计算,以研究立方(Blend)BN(c-BN),AlN(c-AlN)和GaN(c-GaN)中的电子结构和点缺陷的结合,对于高度应变的AlN / BN超晶格。研究了c-BN和c-GaN中的阴离子和阳离子空位,以及各种阴离子和阳离子取代杂质:c-BN中的Be和Mg,c-AlN中的Mg以及c-GaN中的O,Zn和Cd。执行基准计算以验证准确性并优化计算效率。预测c-BN中邻近空位和杂质的原子会有较大的向外弛豫。预计在c-AlN中的Mg杂质附近有较小的向外松弛。除了c-GaN中的Zn杂质外,施主带和受主带倾向于在缺陷部位附近中等至高度局部化。对于松弛的(001)AlN / BN超晶格,可以预测II型排列。 AlN层承受的应变最大,并且带弯曲最大。

著录项

  • 作者

    Pentaleri, E. A.;

  • 作者单位

    San Jose State University.;

  • 授予单位 San Jose State University.;
  • 学科 Physics Condensed Matter.
  • 学位 M.S.
  • 年度 1996
  • 页码 129 p.
  • 总页数 129
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 O49;
  • 关键词

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