X-ray photoelectron and X-ray Auger electron spectroscopy studies of heavy ion irradiated C_(60) films

Amit Kumar; F. Singh; Govind; S.M. Shivaprasad; D.K. Avasthi; J.C. Pivin

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X-ray photoelectron and X-ray Auger electron spectroscopy studies of heavy ion irradiated C_(60) films

机译：重离子辐照C_（60）薄膜的X射线光电子和X射线俄歇电子能谱研究

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The influence of 200 MeV Au ion irradiation on the surface properties of polycrystalline fullerene films has been investigated. The X-ray photoelectron and X-ray Auger electron spectroscopies are employed to study the ion-induced modification of the fullerene, near the surface region. The shift of C 1s core level and decrease in intensity of shake-up satellite were used to investigate the structural changes (like sp~2 to sp~3 conversion) and reduction of π electrons, respectively, under heavy ion irradiation. Further, X-ray Auger electron spectroscopy was employed to investigate hybridization conversion qualitatively as a function of ion fluence.

机译：研究了200 MeV Au离子辐照对多晶富勒烯薄膜表面性能的影响。 X射线光电子和X射线俄歇电子能谱用于研究在表面区域附近离子对富勒烯的改性。利用C 1s核能级的移动和卫星摇动强度的降低来研究重离子辐照下的结构变化（如sp〜2到sp〜3的转换）和π电子的还原。此外，采用X射线俄歇电子能谱法定性研究了杂交转化率与离子通量的关系。

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来源
《Applied Surface Science》 |2008年第22期|p.7280-7284|共5页
作者
Amit Kumar; F. Singh; Govind; S.M. Shivaprasad; D.K. Avasthi; J.C. Pivin;
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作者单位

lnstitut NEEL, CNRS and Universite Joseph Fourier, 25 rue des Martyrs, BP166, 38042 Grenoble Cedex 9, France;

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原文格式 PDF
正文语种 eng
中图分类应用物理学;
关键词
ion irradiation; fullerene; X-ray photoelectron spectroscopy; X-ray-induced Auger electron spectroscopy;

机译：离子辐照富勒烯X射线光电子能谱X射线诱导俄歇电子能谱;

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1. Structure of amorphized C_(60) films studied by Raman spectroscopy and X-ray photoelectron spectroscopy [J] . Ryosuke Ookawa, Katsumi Takahiro, Kiyoshi Kawatsura, Nuclear Instruments & Methods in Physics Research. B, Beam Interactions with Materials and Atoms . 2003,第May期

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3. Surface Depth Analysis For Fluorinated Block Copolymer Films By X-ray Photoelectron Spectroscopy Using C_(60) Cluster Ion Beam [J] . Keiji Tanaka, Noriaki Sanada, Masaya Hikita, Applied Surface Science . 2008,第17期

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6. Effective attenuation lengths for quantitative determination of surface composition by Auger-electron spectroscopy and X-ray photoelectron spectroscopy [O] . A. Jablonski, C. J. Powell -1

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机译：通过X射线光电子和X射线诱导俄歇光谱的al / Cu sub 2 O铝热剂兼容性研究

X-ray photoelectron and X-ray Auger electron spectroscopy studies of heavy ion irradiated C_(60) films

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