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首页> 外文期刊>Applied Surface Science >Characterization of oxide layers on amorphous Zr-based alloys by Auger electron spectroscopy with sputter depth profiling
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Characterization of oxide layers on amorphous Zr-based alloys by Auger electron spectroscopy with sputter depth profiling

机译：溅射深度分布的俄歇电子能谱表征非晶态Zr基合金上的氧化物层

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Amorphous Zr-Cu-Ni-Al-[Ti, Nb] ribbons prepared by melt spinning under argon atmosphere were subjected to electrochemical investigations. Passive films developed at potentiostatic anodic polarization in sulphuric acid solution were investigated by Auger electron spectroscopy (AES) and sputter depth profiling.Changes in the shape of the Auger peaks have been analyzed by factor analysis of the spectra obtained during depth profiling. Pronounced changes in shape and position occur for the Zr, Al, and Ti Auger transitions, but not for Cu and Ni. At least three different peak shapes for O(KVV) were found and attributed to different oxygen binding states. The alloy composition has no significant effect on the thickness and composition of the oxide layer.In multi-element alloys preferential sputtering is a common phenomenon. In the steady state of sputtering, a significant depletion in Cu is found. At the oxide/metal interface, a distinct enrichment of copper is found for all alloys and treatments. The degree of this Cu enrichment depends on the pretreatment. It is higher for the electrochemically-passivated samples than for samples with oxide layers grown during melt spinning. (c) 2005 Elsevier B.V. All rights reserved.
机译：通过在氩气气氛下熔融纺丝制备的非晶Zr-Cu-Ni-Al- [Ti，Nb]薄带进行了电化学研究。通过俄歇电子能谱（AES）和溅射深度分布图研究了在硫酸溶液中在恒电位阳极极化下形成的无源薄膜。 Zr，Al和Ti Auger跃迁的形状和位置发生明显变化，而Cu和Ni则没有。发现了O（KVV）的至少三个不同的峰形，并归因于不同的氧结合状态。合金组成对氧化物层的厚度和组成没有明显影响。在多元素合金中，优先溅射是普遍现象。在溅射的稳态下，发现大量的铜耗尽。在氧化物/金属界面处，发现所有合金和处理过程中都有明显的铜富集。铜的富集程度取决于预处理。对于电化学钝化的样品，它比在熔融纺丝过程中生长有氧化物层的样品要高。 （c）2005 Elsevier B.V.保留所有权利。

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