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Epitaxial Growth and Multiferroic Properties of (001)-Oriented BiFeO3-YMnO3 Films : Energy Harvesting and Systems

机译：（001）取向的BiFeO3-YMnO3薄膜的外延生长和多铁性：能量收集和系统

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摘要

In this paper, high-quality multiferroic (1-x)BiFeO3-xYMnO3 (x=0.05, 0.10, 0.15) thin films were successfully epitaxially grown on (001)SrTiO3 substrates with La0.67Sr0.33MnO3 buffered layers by pulsed laser deposition (PLD). X-ray diffraction shows the thin films are all single-phase perovskite with preferential orientation along the (001) direction. The (002) diffraction angles of thin films (from 0 to 0.15) shift to right, indicating the decrease of lattice parameters. All YMnO3-doped thin films exhibit strong upward self-poling via piezoelectric force microscope (PFM) measurement. Saturated ferroelectric hysteresis loops of thin films cannot be obtained even at the frequency of 50 kHz because of large leakage currents. It is noted that BFO-YMO thin films exhibit ferroelectricity considering the PFM and ferroelectric test. The magnetization measurements show that all BiFeO3-based films exhibit weak ferromagnetic behaviors with saturated magnetization at room temperature. The enhancement of magnetization was observed because of YMO doping, with the maximum saturation magnetization (Ms) of 17.07 emu/cm3 in x=0.10 thin film.
机译：本文通过脉冲激光沉积在（La）0.67Sr0.33MnO3缓冲层上成功地在（001）SrTiO3衬底上外延生长了高质量的多铁（1-x）BiFeO3-xYMnO3（x = 0.05，0.10，0.15）薄膜（ PLD）。 X射线衍射表明，所有薄膜均为单相钙钛矿，沿（001）方向具有优先取向。薄膜的（002）衍射角（从0到0.15）向右偏移，表明晶格参数减小。通过压电力显微镜（PFM）测量，所有YMnO3掺杂的薄膜均显示出较强的向上自极化。由于大的漏电流，即使在50kHz的频率下也无法获得薄膜的饱和铁电磁滞回线。注意，考虑到PFM和铁电测试，BFO-YMO薄膜表现出铁电性。磁化强度测量结果表明，所有BiFeO3基薄膜在室温下均具有饱和的磁化强度，表现出较弱的铁磁性能。由于YMO掺杂，观察到了磁化强度的增强，在x ＝ 0.10的薄膜中最大饱和磁化强度（Ms）为17.07emu / cm 3。

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