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Numerical Investigation on Contactless Methods for Identifying Defects in High-Temperature Superconducting Film

机译:非接触式高温超导薄膜缺陷识别方法的数值研究

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A numerical method has been developed for analyzing the shielding current density in a high-temperature superconducting (HTS) film containing multiple cracks. By using the method, the inductive method and the scanning permanent magnet method for contactlessly measuring the critical current density has been successfully reproduced, and the identifiability of the multiple cracks in the HTS film has been investigated. The results of computations show that, when the cracks are separated from each other, the multiple cracks can be detected individually in the two types of the contactless method. On the other hand, if the crack is pretty close to the interface, the multiple cracks is considered as a single crack. However, the crack position can be detected collectively. Therefore, the contactless methods is useful method for detecting the multiple cracks in an HTS film.
机译:已经开发出一种数值方法来分析包含多个裂纹的高温超导(HTS)膜中的屏蔽电流密度。通过使用该方法,已经成功地再现了用于非接触式测量临界电流密度的感应方法和扫描永磁体方法,并且已经研究了HTS膜中多个裂纹的可识别性。计算结果表明,当裂纹彼此分离时,可以通过两种非接触方法分别检测多个裂纹。另一方面,如果裂纹非常靠近界面,则将多个裂纹视为单个裂纹。但是,裂纹位置可以被一起检测。因此,非接触方法是用于检测HTS膜中的多个裂纹的有用方法。

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