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首页> 外文期刊>Plasma and Fusion Research >Extension of Wavelength Range in Absolute Intensity Calibration of Space-Resolved EUV Spectrometer for LHD Diagnostics
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Extension of Wavelength Range in Absolute Intensity Calibration of Space-Resolved EUV Spectrometer for LHD Diagnostics

机译：用于LHD诊断的空间分辨EUV光谱仪绝对强度校准中的波长范围扩展

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摘要

A space-resolved extreme ultraviolet (EUV) spectrometer has been upgraded by extending the wavelength range to 30-650 ? to explore impurity line emissions existing at shorter and longer wavelength sides. The absolute intensity calibration is implemented for measurement in the extended wavelength based on bremsstrahlung profiles simultaneously measured in EUV and visible ranges. For the purpose a wider entrance slit of 200 μm and a wider space-resolved slit of 1.0 mm are adopted to increase the number of photons to the spectrometer. As a result, the bremsstrahlung intensity can be enhanced by order of magnitude. A centrally peaked high-density discharge at n e(0) ≥ 1014 cm?3 is also used for the accurate calibration. Thus, the calibration becomes possible, even in longer wavelength side at λ ≥ 400 ?. The result at shorter wavelength range of 30-90 ? shows a flat calibration factor, suggesting sudden changes of holographic grating efficiency and CCD detection efficiency, while the result at longer wavelength side of λ ≥ 400 ? shows a simple extension of the previous calibration factor.
机译：通过将波长范围扩展到30-650？，可以升级空间分辨的极紫外（EUV）光谱仪。探索存在于较短和较长波长侧的杂质线发射。绝对强度校准的实现是基于同时在EUV和可见范围内测量的致辐射剖面，在扩展波长中进行测量。为此目的，采用了200μm的更宽的入射狭缝和1.0 mm的更宽的空间分辨狭缝，以增加光谱仪的光子数量。结果，可以提高致辐射强度的数量级。在n e （0）≥10 14 cm ？3 处的中心峰值高密度放电也用于精确校准。因此，即使在λ≥400λ的较长波长侧，也可以进行校准。在较短的30-90波长范围内得到的结果校正因子平坦，表明全息光栅效率和CCD检测效率突然变化，而在λ≥400？显示了先前校准因子的简单扩展。

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