Nanoscale Microstructural Analyses by Atom Probe Field Ion Microscopy

K. Hono; M. Murayama

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Nanoscale Microstructural Analyses by Atom Probe Field Ion Microscopy

机译：原子探针场离子显微镜的纳米级微观结构分析

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Recent progress in atom probe field ion microscopy (APFIM) and its application to nanoscale microstructrual studies of metallic materials are reviewed. By employing a three dimensional atom probe (3DAP), it is possible to map out elemental distributions in the real space with almost an atomic resolution, and chemical analysis of interfaces and nanoparticles can be made with improved accuracy in comparison with the conventional atom probe. Unique features of atom probe field ion microscopy are demonstrated by showing recent examples of APFIM and 3DAP applications to nanoscale characterizations of aluminum alloys, nanocrystalline magnetic materials and steels.

机译：原子探针场离子显微镜（APFIM）的最新进展及其在金属材料的纳米级微观结构研究中的应用进行了综述。通过使用三维原子探针（3DAP），可以以几乎原子的分辨率绘制出真实空间中的元素分布，并且与传统的原子探针相比，可以以更高的精度进行界面和纳米颗粒的化学分析。通过展示APFIM和3DAP在铝合金，纳米晶磁性材料和钢的纳米级表征中的最新应用实例，证明了原子探针场离子显微镜的独特功能。

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《High Temperature Materials and Processes》 |1998年第2期|p.69-86|共18页
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K. Hono; M. Murayama;
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正文语种 eng
中图分类金属学与热处理;
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1. Microstructural evolution and age hardening in aluminium alloys: atom probe field-ion microscopy and transmission electron microscopy studies [J] . S.P.Ringer, K.Hono Materials Characterization . 2000,第1a2期

机译：铝合金的显微组织演变和时效硬化：原子探针场离子显微镜和透射电子显微镜研究
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机译：纳米级成像和探测催化表面反应：O_2-H_2 / Rh和NO-H_2 / Pt的场离子显微镜和原子探针研究
3. Quantitative binomial distribution analyses of nanoscale like-solute atom clustering and segregation in atom probe tomography data [J] . Moody MP, Stephenson LT, Ceguerra AV, Microscopy research and technique . 2008,第7期

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4. INTEGRATION OF ELECTRON BACKSCATTER DIFFRACTION, TRANSMISSION KIKUCHI DIFFRACTION AND ATOM PROBE MICROSCOPY: A SUPERIOR WORKFLOW FOR NANOSCALE GEOCHEMISTRY [C] . Steven M. Reddy, D.W. Saxey, W.D.A. Rickard, 15th European workshop on modern developments and applications in microbean analysis, 7th meeting of the International Union of Microbean Analysis Societies . 2017

机译：电子背散射，透射菊池衍射和原子探针显微镜的集成：纳米尺度地球化学的优良工作流
5. Scanning probe microscopy studies of the highly strained epitaxy of indium arsenide on gallium arsenide(001) and scanning probe based imaging and manipulation of nanoscale three-dimensional objects. [D] . Ramachandran, T. R. 1998

机译：砷化镓（001）上砷化铟高度应变外延的扫描探针显微镜研究，以及基于扫描探针的纳米级三维物体的成像和操作。
6. Probing the Location and Speciation of Elements in Zeolites with Correlated Atom Probe Tomography and Scanning Transmission X‐Ray Microscopy [O] . Dr. Joel E. Schmidt, Xinwei Ye, Ilse K. van Ravenhorst, -1

机译：用相关原子探针层析成像和扫描透射X射线显微镜探测沸石中元素的位置和形态
7. Nanoscale Microstructural Analyses by Atom Probe Field Ion Microscopy [O] . Hono And Murayama, K. Hono, M. Murayama 2007

机译：原子探针场离子显微镜纳米级微结构分析
8. Microstructural development in PWA-1480 electron beam welds: An atom probe field ion microscopy study [R] . David, S. A. , Miller, M. K. , Babu, S. S. 1995

机译：pWa-1480电子束焊接的微观结构发展：原子探针场离子显微镜研究

Nanoscale Microstructural Analyses by Atom Probe Field Ion Microscopy

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