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Similarity of potential-induced degradation in superstrate-type thin-film CdTe and Si photovoltaic modules

机译:上覆型薄膜CdTe和Si光伏组件中电势降解的相似性

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摘要

Degradation phenomena under high-voltage stress, referred to as potential-induced degradation (PID) in general, were studied in superstrate-type thin-film photovoltaic (PV) modules, such as CdTe and thin-film Si PV modules. Both deterioration in the PV performance and delamination of the transparent conducting oxide (TCO) layer on the glass substrate were observed by the PID test for both PV modules, although a change in the PV parameters during the PID test with negative voltage application was somewhat different between them. It was also found for both PV modules that recovery from PID is accomplished by positive voltage application and that quick and drastic deterioration in all the PV parameters occurs by the second negative voltage application after recovery. It is suggested that the common origin of PID for superstrate-type thin-film PV modules is damage and delamination of the TCO layer. (C) 2019 The Japan Society of Applied Physics
机译:在诸如CdTe和薄膜Si PV组件之类的上覆型薄膜光伏(PV)组件中,研究了高压应力下的退化现象,通常称为电位诱导退化(PID)。通过PID测试对两个PV模块都观察到了PV性能的劣化和玻璃基板上透明导电氧化物(TCO)层的分层,尽管在施加负电压的PID测试期间PV参数的变化有些不同它们之间。还发现,对于两个PV模块,从PID的恢复都是通过施加正电压来完成的,而所有PV参数的迅速而急剧的恶化都是在恢复之后的第二次施加负电压时发生的。建议用于覆膜型薄膜光伏组件的PID的常见来源是TCO层的损坏和分层。 (C)2019日本应用物理学会

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  • 来源
    《Japanese journal of applied physics》 |2019年第sb期|SBBF07.1-SBBF07.6|共6页
  • 作者单位

    Natl Inst Adv Ind Sci & Technol, Reaserch Ctr Photovolta, Tsukuba, Ibaraki 3058568, Japan;

    Natl Inst Adv Ind Sci & Technol, Reaserch Ctr Photovolta, Tsukuba, Ibaraki 3058568, Japan;

    Kisarazu Coll, Natl Inst Technol, Chiba 2920041, Japan;

    Kisarazu Coll, Natl Inst Technol, Chiba 2920041, Japan;

    Kisarazu Coll, Natl Inst Technol, Chiba 2920041, Japan;

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